PRODUCTS

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Test Pin Probe TPP15

Model: TPP15

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The Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with a Delrin® handle. Meets IEC 60950 and 61032, Figure 9 (Test Probe 13).

PK950

Probe Kit for IEC 950

Model: PK950

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Five access probes for testing to IEC 60950. Custom kits assembled to meet your testing needs. Contact us for more information.

TPP50

Test Pin Probe – 50 mm

Model: TPP50

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Used to test for accessibility and meets IEC, CSA, and latest UL requirements.

THP601

Test Hook Probe

Model: THP601

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IEC testing of integrity of enclosure seams.

SAW745A

Saw Blade Accessibility Probe

Model: SAW745A

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Required by IEC60745-2-5 and 60745-2-11. They are safety requirements for saws.

JP03

Jewelry Probe – 3mm diameter

Model: JP03

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Simulates jewelry to IEC 61010-1, Clause 6.2.3.

ITB20

Ball Accessibility Probe with Handle, 50 mm.

Model: ITB20

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IEC 529, IP1 For impact and access testing.

FWP10

Food Waste Probe

Model: FWP10

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The FWP10 Food Waste Probe is used for checking food waste disposal units. It is used to test to the following standards: IEC60335-2-16, IEC61032 and UL430.

1

Amusement Ride Machine Probe

Model: AP75

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This is a 75mm sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-24, clause 20.2. It is made of aluminum to conserve weight.

2

Amusement Ride Machine Probe

Model: AP150

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This Amusement Machine Probe is a 150mm wooden sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-82, clause 20.2. It is made of wood to conserve weight.

4

Jointed Finger Probe

Model: JFP10

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The Jointed Finger Probe meets all the different requirements that are in the IEC standards.

5

Unjointed Finger Probe

Model: UFP20

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Finger Probe, Unjointed – IEC Rigid finger for insertion and force testing.

JFP335-2-14 (800x533)

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: UL 60950

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Jointed Finger Probe

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Finger Probe, Unjointed

Finger Probe, Unjointed

Model: UFP25
Standard: IEC 61032

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This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult. The UFP25 meets IEC 61032 requirements, Figure 7, Test Probe 11.

Finger Probe, Unjointed - IEC

Finger Probe, Unjointed – IEC

Model: UFP20
Standard: IEC 60950, 61010

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Rigid finger for insertion and force testing.

Jointed Children's Finger Probe

Jointed Children’s Finger Probe

Model: UL1017
Standard: UL1017

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This is a precision probe made in accordance with UL1017 and related standards.

UL Standard Articulated Finger Probe 1

UL Standard Articulated Finger Probe

Model: ULP20

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Metal UL test finger for accessibility testing.

ULP04

UL Standard Articulated Finger Probe

Model: ULP04

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ULP04 Machined plastic UL test finger probe for accessibility testing.

Test Rod Probes

Test Rod Probes

Standard: IEC, UL

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Several models to choose from… To test to many IEC standards and UL standards.

Coin Probe

Coin Probe

Model: CP10
Standard: UL 1410 and 6500

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4 coins in one – checks access by US coins. UL Standard

BP10-lg

Blunt Probe

Model: BP10
Standard: UL 1310

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The Blunt Probe is used in UL 1310 Standard for Class 2 Power Units.