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UL Metal Articulated Probe – Model ULP20-68

Model: ULP20
Standard: Standard:IEC 62638-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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The UL Metal Articulated Probe is a standard articulated finger as required by Underwriters Laboratories in many of their standards. It is a jointed test probe specifically designed to test equipment likely to be accessible by children. This probe also applies to more stringent international standards for hazardous parts access, such as IEC 62638-1. The

UL Metal Rigid Finger Probe – Model ULP25

Standard: Standard:IEC 62638-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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The UL Metal Rigid Probe is a highly accurate probe made in accordance with all the IEC, UL and International Standards listed below. It is a probe specifically designed to test equipment likely to be accessible by children. This rigid probe is made for forceful insertion where the flexibility of the UL Metal Articulated Probe,

UL Plastic Articulated Probe – Model ULP04

Model: ULP04
Standard: Standard:IEC 62638-1, Figure V.1; UL PA100A (M)

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The UL Plastic Articulated Probe is a standard articulated finger as required by Underwriters Laboratories in many of their standards. It is a jointed test probe specifically designed to test equipment likely to be accessible by children. This probe also applies to more stringent international standards for hazardous parts access, such as IEC 62638-1. The

Jointed Finger Probe – Model JFP10

Model: JFP10
Standard: Standard:IEC 62638-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC IEC 60529, Figure 1; IEC IEC 60950, Clause 2.1.1.1b Figure 2A; IEC IEC 60601-1:2005, Figure 7; IEC IEC 61010-1:2001, Figure B.2; IEC UL 1450, Figure 12.4; IECIEC 60335-2-3, Clause 21.

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This is a precision probe made in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is

Test Pin Probe – Model TPP15

Model: TPP15
Standard: Standard:IEC 60950-1, Figure 2b;IEC 61032, Figure 9 Test Probe 13;IEC 60601,Figure 8

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This high quality precision pin probe is supplied in accordance with all IEC standards listed below. The Test Pin Probe, Model TPP15, is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. Ergonomics designs and manufactures these probes in our own facilities, ensuring top quality parts at a competitive

Probe Kit for IEC 60950 – Model PK950

Model: PK950
Standard: Standard:IEC 60950; UL 1459; IEC 61010 - 1

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Safety Test Probe Kit PK950 contains the probes necessary for testing to IEC 60950: JFP10 – Jointed Finger Probe UFP20 – Unjointed (Rigid) Finger Probe TPP15 – Test Pin Probe ITB15 – Ø50mm Impact Test Ball, 500 grams TAP40 – Telecommunications Access Probe   Accessibility probes are used to test the size of openings to

Test Pin Probe – 50 mm

Model: TPP50
Standard: IEC 61032-1998, Figure 8, Test Probe 12

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Used to test for accessibility and meets IEC, CSA, and latest UL requirements.

Test Hook Probe

Model: THP601
Standard: IEC 60601-1-2005, Figure 7; IEC 62368-1, Figure 20; IEC 60065, Figure 4

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IEC testing of integrity of enclosure seams.

Saw Blade Accessibility Probe

Model: SAW745A
Standard: IEC 60745-2-5, Probe A

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Required by IEC60745-2-5 and 60745-2-11. They are safety requirements for saws.

Jewelry Probe – 3 mm diameter, Model JP03

Model: JP03
Standard: IEC 61010-1, Clause 6.2.4

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This probe simulates jewelry to IEC 61010-1, Clause 6.2.4. The probe length is 100 mm long, and is made of white Delrin, The probe diameter is made of steel and is 3 mm in diameter.

50mm Diameter Ball Accessibility Probe with Handle – Model ITB20

Model: ITB20
Standard: IEC 61032, Figure 1 Test Probe A; IEC 61032, Figure 5 Test Probe 1; IEC 60529, Table 6; IEC 60529, Figure M.1; UL 1082

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This 50mm diameter Ball Accessibilty Probe is a specially machined assembly to test impact resistance and accessibility  according to IEC standards below, as well CSA and UL standards. This assembly consists of three (3) components.  The first item is Ergonomics item ITB15, a 50 mm diameter impact test ball.   The impact ball is connected to

Food Waste Probe

Model: FWP10
Standard: 61032-1998 Figure 14, probe 31

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The FWP10 Food Waste Probe is used for checking food waste disposal units. It is used to test to the following standards: IEC60335-2-16, IEC61032 and UL430.

Amusement Ride Machine Probe

Model: AP75

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This is a 75mm sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-24, clause 20.2. It is made of aluminum to conserve weight.

Amusement Ride Machine Probe

Model: AP150

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This Amusement Machine Probe is a 150mm wooden sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-82, clause 20.2. It is made of wood to conserve weight.

Unjointed Finger Probe – Model UFP20

Model: UFP20
Standard: Standard:IEC 60950; IEC 61010-1:2001; IEC 60601; IEC 60335

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This high quality precision probe, Model UFP20, is supplied in accordance with all IEC standards listed below. It is also used for CSA and UL requirements. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: IEC 60950; IEC 62638-1, Figure V.4

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Unjointed Finger Probe – Model UFP25

Model: UFP25
Standard: Standard:IEC 61032:1998, Figure 7 Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

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This high quality precision probe, Model UFP25, is supplied in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Finger Probe, Unjointed – IEC

Model: UFP20
Standard: IEC 60950 ; IEC 60335, test Probe 11

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Rigid finger for insertion and force testing.

Jointed Children’s Finger Probe

Model: UL1017
Standard: UL1017

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This is a precision probe made in accordance with UL1017 and related standards.

Test Rod Probes


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Several models to choose from… To test to many IEC standards and UL standards.

Coin Probe

Model: CP10
Standard: UL 1410 and 6500

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4 coins in one – checks access by US coins. UL Standard

Blunt Probe

Model: BP10
Standard: UL 1310

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The Blunt Probe is used in UL 1310 Standard for Class 2 Power Units.