Access Probes Archives - Ergonomics, Inc.

Jointed Finger Probe – Model JFP10

Model: JFP10

Standard: Standard:IEC 62638-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC IEC 60529, Figure 1; IEC IEC 60950, Clause 2.1.1.1b Figure 2A; IEC IEC 60601-1:2005, Figure 7; IEC IEC 61010-1:2001, Figure B.2; IEC UL 1450, Figure 12.4; IECIEC 60335-2-3, Clause 21.

This is a precision probe made in accordance with all IEC standards listed on page two. It is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the

Test Pin Probe TPP15

Model: TPP15

Standard: IEC 60950-1-2005, Figure 2B; IEC 61032:1998, Figure 9, Test Probe 13; IEC 60601-1:2005, Figure 8

The Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with a Delrin® handle. Meets IEC 60950 and 61032, Figure 9 (Test Probe 13).

Probe Kit for IEC 950

Model: PK950

Standard: IEC 60950

Five access probes for testing to IEC 60950. Custom kits assembled to meet your testing needs. Contact us for more information.

Test Pin Probe – 50 mm

Model: TPP50

Standard: IEC 61032-1998, Figure 8, Test Probe 12

Used to test for accessibility and meets IEC, CSA, and latest UL requirements.

Test Hook Probe

Model: THP601

Standard: IEC 60601-1-2005, Figure 7; IEC 62368-1, Figure 20; IEC 60065, Figure 4

IEC testing of integrity of enclosure seams.

Saw Blade Accessibility Probe

Model: SAW745A

Standard: IEC 60745-2-5, Probe A

Required by IEC60745-2-5 and 60745-2-11. They are safety requirements for saws.

Jewelry Probe – 3mm diameter

Model: JP03

Standard: IEC 61010-1, Clause 6.2.4

Simulates jewelry to IEC 61010-1, Clause 6.2.3.

Ball Accessibility Probe with Handle, 50 mm.

Model: ITB20

Standard: IEC 61032, Figure 1, Test Probe A; IEC 61032, Figure 5, Test Probe 1; IEC 60529, Table 6; IEC 60529, Figure M.1

IEC 529, IP1 For impact and access testing.

Food Waste Probe

Model: FWP10

Standard: 61032-1998 Figure 14, probe 31

The FWP10 Food Waste Probe is used for checking food waste disposal units. It is used to test to the following standards: IEC60335-2-16, IEC61032 and UL430.

Amusement Ride Machine Probe

Model: AP75

This is a 75mm sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-24, clause 20.2. It is made of aluminum to conserve weight.

Amusement Ride Machine Probe

Model: AP150

This Amusement Machine Probe is a 150mm wooden sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-82, clause 20.2. It is made of wood to conserve weight.

Unjointed Finger Probe

Model: UFP20

Standard: IEC 60950 ; IEC 60335, test Probe 11

Finger Probe, Unjointed – IEC Rigid finger for insertion and force testing.

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14

Standard: IEC 60335

The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders. Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2

Standard: IEC 60950; IEC 62638-1, Figure V.4

The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Jointed Finger Probe

Model: JFP1089

Standard: GR-1089-CORE

As required by Telecordia Standard GR-1089-CORE

Finger Probe, Unjointed

Model: UFP25

Standard: IEC 61032-1998, Figure 7, Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult. The UFP25 meets IEC 61032 requirements, Figure 7, Test Probe 11.