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Jointed Finger Probe – Model JFP10

Model: JFP10
Standard: Standard:IEC 62638-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC IEC 60529, Figure 1; IEC IEC 60950, Clause 2.1.1.1b Figure 2A; IEC IEC 60601-1:2005, Figure 7; IEC IEC 61010-1:2001, Figure B.2; IEC UL 1450, Figure 12.4; IECIEC 60335-2-3, Clause 21.

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This is a precision probe made in accordance with all IEC standards listed on page two. It is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the

Unjointed Finger Probe

Model: UFP20
Standard: IEC 60950 ; IEC 60335, test Probe 11

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Finger Probe, Unjointed – IEC Rigid finger for insertion and force testing.

Jointed Finger Probe for Testing Appliances

Model: JFP335-20.2
Standard: IEC 60335 Clause 20.2; EN 50636-2-107 Clause 20.102.4.2.2

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The JFP335-20.2 is one of the new accessibility probes required by IEC 60335-1 clause 20.2 for testing the accessibility of moving parts in appliances.

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: IEC 60950; IEC 62638-1, Figure V.4

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Telecom Access Probe – IEC

Model: TAP40
Standard: IEC 62368-1, Clause V.1.4, Figure V.3; IEC 60950-1:2005, Clause 2.1.1.1b Figure 2c

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Check access to telecommunications voltages.

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Finger Probe, Jointed Child (Set of 2) – IEC 61032 and US Fed. Regs.

Model: JFP32
Standard: IEC 61032

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Set of two child-sized test fingers, may be  purchased separately.

Finger Probe, Unjointed

Model: UFP25
Standard: IEC 61032-1998, Figure 7, Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

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This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult. The UFP25 meets IEC 61032 requirements, Figure 7, Test Probe 11.

Finger Probe, Unjointed – IEC

Model: UFP20
Standard: IEC 60950 ; IEC 60335, test Probe 11

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Rigid finger for insertion and force testing.

Fingernail Test Probe

Model: FNP335
Standard: IEC 60335-1, Clause 21.2 and 22.11, Figure 7

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IEC and UL testing security of snap-on parts.

Jointed Children’s Finger Probe

Model: UL1017
Standard: UL1017

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This is a precision probe made in accordance with UL1017 and related standards.

UL Standard Articulated Finger Probe

Model: ULP20

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Metal UL test finger for accessibility testing.

UL Standard Articulated Finger Probe

Model: ULP04
Standard: UL

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ULP04 Machined plastic UL test finger probe for accessibility testing.