PRODUCTS

UL Metal Articulated Probe – Model ULP20-68

Model: ULP20
Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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The UL Metal Articulated Probe is a standard articulated finger as required by Underwriters Laboratories in many of their standards. It is a jointed test probe specifically designed to test equipment likely to be accessible by children. This probe also applies to more stringent international standards for hazardous parts access, such as IEC 62368-1. The

UL Metal Rigid Finger Probe – Model ULP25

Standard: Standard:IEC 62368-1, Figure V.1; CSA C22.2 No47-13, Figure 1; ANSI Z21.88-2017, Figure 8, Accessibility Probe; CSA 2.33-2017, Figure 8, Accessibility Probe; UL PA100A (M); UL 1492, Figure 18.1

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The UL Metal Rigid Probe is a highly accurate probe made in accordance with all the IEC, UL and International Standards listed below. It is a probe specifically designed to test equipment likely to be accessible by children. This rigid probe is made for forceful insertion where the flexibility of the UL Metal Articulated Probe,

UL Plastic Articulated Probe – Model ULP04

Model: ULP04
Standard: Standard:IEC 62368-1, Figure V.1; UL PA100A (M)

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The UL Plastic Articulated Probe is a standard articulated finger as required by Underwriters Laboratories in many of their standards. It is a jointed test probe specifically designed to test equipment likely to be accessible by children. The design is made of high quality, durable Delrin plastic, offering a more economical version to meet the

Jointed Finger Probe – Model JFP10

Model: JFP10
Standard: Standard:IEC 62368-1, Figure V.2; IEC 61032 Figure 2, Test Probe B; IEC 60529, Figure 1; IEC 60950, Clause 2.1.1.1b Figure 2A; IEC 60601-1:2005, Figure 7; IEC 61010-1:2001, Figure B.2; IEC UL 1450, Figure 12.4; IEC 60335-2-3, Clause 21.

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This is a precision probe made in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is

Unjointed Finger Probe – Model UFP20

Model: UFP20
Standard: Standard:IEC 60950; IEC 61010-1:2001; IEC 60601; IEC 60335

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This high quality precision probe, Model UFP20, is supplied in accordance with all IEC standards listed below. It is also used for CSA and UL requirements. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Jointed Finger Probe for Testing Appliances

Model: JFP335-20.2
Standard: IEC 60335 Clause 20.2; EN 50636-2-107 Clause 20.102.4.2.2

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The JFP335-20.2 is one of the new accessibility probes required by IEC 60335-1 clause 20.2 for testing the accessibility of moving parts in appliances.

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.  Meets the latest CB scheme requirements.

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: IEC 60950; IEC 62368-1, Figure V.4

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Telecommunications Access Probe – Model TAP40

Model: TAP40
Standard: Standard:IEC 62368-1, Clause V.1.4, Figure V.3; IEC 60950-1,Clause 2.1.1.d Figure 2c

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This high quality precision probe, Model TAP40, is supplied in accordance with all IEC standards listed below. It is also used for CSA and UL requirements. The Telecommunications Access Probe is designed to check for limited access to telecommunications voltages (TNV), mainly encompassing telephone jacks and operator areas. This probe complies with all the standards

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Jointed Children’s Finger Probes (Set of 2) – Model JFP32

Model: JFP32
Standard: Standard:IEC 61032:1998, Figure 13 Test Probe 19;IEC 61032:1998, Figure 12 Test Probe 18;U.S. Federal Regulations, Title 16 Volume 2 Chapter 11 Part 1500 for Consumer Products

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The Jointed Children’s Finger Probes are supplied in a set of two. Model JFP32A is a simulation for zero to thirty six month old children. The second probe, Model JFP32B, is a simulation for three to fourteen year old children. These test fingers are used to test for protection against access to hazardous parts with

Unjointed Finger Probe – Model UFP25

Model: UFP25
Standard: Standard:IEC 61032:1998, Figure 7 Probe 11; IEC 61010-1:2001, Figure B.1; IEC 60601

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This high quality precision probe, Model UFP25, is supplied in accordance with all IEC standards listed below. It is also used for Canadian and USA standards. The Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe, Model JFP10, would be difficult. Ergonomics designs and manufactures these probes in

Finger Probe, Unjointed – IEC

Model: UFP20
Standard: IEC 60950 ; IEC 60335, test Probe 11

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Rigid finger for insertion and force testing.

Fingernail Test Probe

Model: FNP335
Standard: IEC 60335-1, Clause 21.2 and 22.11, Figure 7

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IEC and UL testing security of snap-on parts.

Jointed Children’s Finger Probe

Model: UL1017
Standard: UL1017

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This is a precision probe made in accordance with UL1017 and related standards.