PRODUCTS

PK950

Probe Kit for IEC 950

Model: PK950

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Five access probes for testing to IEC 60950. Custom kits assembled to meet your testing needs. Contact us for more information.

TPP50

Test Pin Probe – 50 mm

Model: TPP50

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Used to test for accessibility and meets IEC, CSA, and latest UL requirements.

THP601

Test Hook Probe

Model: THP601

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IEC testing of integrity of enclosure seams.

SAW745A

Saw Blade Accessibility Probe

Model: SAW745A

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Required by IEC60745-2-5 and 60745-2-11. They are safety requirements for saws.

JP03

Jewelry Probe – 3mm diameter

Model: JP03

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Simulates jewelry to IEC 61010-1, Clause 6.2.3.

ITB20

Ball Accessibility Probe with Handle, 50 mm.

Model: ITB20

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IEC 529, IP1 For impact and access testing.

FWP10

Food Waste Probe

Model: FWP10

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The FWP10 Food Waste Probe is used for checking food waste disposal units. It is used to test to the following standards: IEC60335-2-16, IEC61032 and UL430.

1

Amusement Ride Machine Probe

Model: AP75

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This is a 75mm sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-24, clause 20.2. It is made of aluminum to conserve weight.

2

Amusement Ride Machine Probe

Model: AP150

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This Amusement Machine Probe is a 150mm wooden sphere used for testing kiddie rides and driving simulators according to IEC 60335-2-82, clause 20.2. It is made of wood to conserve weight.

4

Jointed Finger Probe

Model: JFP10

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The Jointed Finger Probe has been redesigned to do the job of the former JFP10.

5

Unjointed Finger Probe

Model: UFP20

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Finger Probe, Unjointed – IEC Rigid finger for insertion and force testing.

Jointed Finger Probe for Testing Appliances

Jointed Finger Probe for Testing Appliances

Model: JFP335-20.2
Standard: IEC 60335-1

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The JFP335-20.2 is one of the new accessibility probes required by IEC 60335-1 clause 20.2 for testing the accessibility of moving parts in appliances.

Jointed Finger Probe for Testing Blenders

Jointed Finger Probe for Testing Blenders

Model: JFP335-2-14
Standard: IEC 60335

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The JFP335-2-14 is one of the new accessibility probes required by IEC 60335 for testing blenders.

Wedge Probe for Testing Document Shredders

Wedge Probe for Testing Document Shredders

Model: NAF2
Standard: UL 60950

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The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders.

Telecom Access Probe - IEC

Telecom Access Probe – IEC

Model: TAP40
Standard: IEC 60950, IEC 60065, UL, CSA

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Check access to telecommunications voltages.

Jointed Finger Probe

Jointed Finger Probe

Model: JFP1089
Standard: GR-1089-CORE

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As required by Telecordia Standard GR-1089-CORE

Finger Probe, Jointed Child (Set of 2) - IEC 61032 and US Fed. Regs.

Finger Probe, Jointed Child (Set of 2) – IEC 61032 and US Fed. Regs.

Model: JFP32
Standard: IEC 61032

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Set of two child-sized test fingers, may be  purchased separately.

Finger Probe, Unjointed

Finger Probe, Unjointed

Model: UFP25
Standard: IEC 61032

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This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult. The UFP25 meets IEC 61032 requirements, Figure 7, Test Probe 11.

Finger Probe, Unjointed - IEC

Finger Probe, Unjointed – IEC

Model: UFP20
Standard: IEC 60950, 61010

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Rigid finger for insertion and force testing.

Finger Probe, Jointed

Finger Probe, Jointed

Model: JFP10
Standard: IEC

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Test finger required for all access testing.

Fingernail Test Probe

Fingernail Test Probe

Model: FNP335
Standard: IEC 60335, UL

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IEC and UL testing security of snap-on parts.

Jointed Children's Finger Probe

Jointed Children’s Finger Probe

Model: UL1017
Standard: UL1017

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This is a precision probe made in accordance with UL1017 and related standards.

UL Standard Articulated Finger Probe 1

UL Standard Articulated Finger Probe

Model: ULP20

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Metal UL test finger for accessibility testing.

ULP04

UL Standard Articulated Finger Probe

Model: ULP04

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ULP04 Machined plastic UL test finger probe for accessibility testing.

Rigid Sphere

Rigid Sphere, 1/2 inch mm

Model: ITB50
Standard: U.S.

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For U.S. standards.

Test Rod Probes

Test Rod Probes

Standard: IEC, UL

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Several models to choose from… To test to many IEC standards and UL standards.

Screw-base Lamp Gauge

Screw-base Lamp Gauge

Model: SBL100
Standard: UL 588

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The Screw-Base Lamp Gauge is designed to evaluate live parts of intermediate screw-base lamps. It is made of stainless steel. This gauge meets UL 588 standard.

Rubber Ball for Dynamic Stability - 2.187 inch

Rubber Ball for Dynamic Stability – 2.187 inch

Model: ITB82
Standard: UL

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Rubber ball used for dynamic stability testing to UL (USA) standards.

Impact Test Ball

Impact Test Ball – 2 Inch

Model: ITB2
Standard: UL250

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The Impact Test Ball is a specially machined ball to test impact resistance according to International Standards.

Enamel Wire Probe 1

Enamel Wire Probe

Model: EWP25
Standard: UL

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Used for testing to many UL Standards checking access to enamel coated wire.

Enamel Wire Probe

Enamel Wire Probe

Model: EWP10
Standard: UL

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UL Test for access to enamel coated wire.

Moving Parts Probe

Moving Parts Probe

Model: MPP507
Standard: UL 507

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The Moving Parts Probe is used in UL 507 to test for hazards from moving parts.

Coin Probe

Coin Probe

Model: CP10
Standard: UL 1410 and 6500

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4 coins in one – checks access by US coins. UL Standard

Foot Probe

Foot Probe

Model: FP11
Standard: IEC 60335-2-92, UL 82, and UL 1447

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For Standards IEC 60335-2-92, UL 82, and UL 1447. The standard requires rotary power mowers to have protective shields.

BP10-lg

Blunt Probe

Model: BP10
Standard: UL 1310

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The Blunt Probe is used in UL 1310 Standard for Class 2 Power Units.